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Introduction: Impact of statistical variability and reliability on circuit design (S. Nassif, IBM)
TCAD simulation of statistical variability
A. Brown (Glasgow University)
V. Moroz (Synopsys)
S. Toriyama (Toshiba)
Reliability impact and scaling trends
K. Cao (University of Arizona)
K. Takeuchi (Toshiba)
T.Grasser (TU Vienna)
Statistical compact model strategies and statistical circuit simulation
M. Miura-Mattausch (Hiroshima University)
J. Victory (Sentinel)
A. Juge (ST Microelectronics)
Closing: Interaction between TCAD, compact models and circuit simulation to support statistical and robust design (A. Asenov)